Experimental investigation of total electron emission yield of polyimide film under various temperatures

As the thermal variation may change total electron emission yield (TEEY) of materials and ultimately result in unexpected surface charging, it is necessary to study TEEY at various temperatures. In this research, we first updated measurement system with a newly designed sample stage for different temperatures (−50, 25, 100 °C) primary from 25 eV 10 keV. By using 30 μs/20 nA beam scanning method mitigate could be accurately obtained dielectrics. Then, chose kind polyimide film (Kapton 100H) used on spacecraft gold compare The results show that high temperature leads higher Kapton films, whereas −50 °C also same. On other hand, remains same view hole density charge transportation, films was analyzed by bulk conduction, mobility, electron–hole recombination property. It considered dissipation rate holes sensitive temperature, furthermore, dependent temperature.